Open AccessFocus on analytical equipment and diagnostics
Author(s) -
Andreas Mandelis
Publication year - 2013
Publication title -
physics today
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.594
H-Index - 112
eISSN - 1945-0699
pISSN - 0031-9228
DOI - 10.1063/pt.3.2089
Subject(s) - secondary ion mass spectrometry , mass spectrometry , spectrometer , ion , ion beam , analytical chemistry (journal) , chemistry , materials science , physics , optics , organic chemistry , chromatography
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