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Activation of implanted Si, Ge, and Sn donors in high-resistivity halide vapor phase epitaxial β-Ga2O3:N with high mobility
Author(s) -
Joseph Spencer,
Marko J. Tadjer,
Alan G. Jacobs,
Michael A. Mastro,
John L. Lyons,
Jaime A. Freitas,
James C. Gallagher,
Quang Tu Thieu,
Kohei Sasaki,
Akito Kuramata,
Yuhao Zhang,
Travis J. Anderson,
Karl D. Hobart
Publication year - 2022
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0120494
Subject(s) - analytical chemistry (journal) , ohmic contact , hall effect , epitaxy , doping , sheet resistance , materials science , secondary ion mass spectrometry , ion implantation , impurity , dopant activation , electrical resistivity and conductivity , electron mobility , dopant , spreading resistance profiling , chemistry , ion , optoelectronics , nanotechnology , engineering , organic chemistry , chromatography , layer (electronics) , electrical engineering

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