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Measurement of shock roughness due to phase plate speckle imprinting relevant for x-ray diffraction experiments on 3rd and 4th generation light sources
Author(s) -
M. G. Gorman,
S. J. Ali,
P. M. Celliers,
J. Peebles,
David J. Erskine,
J. M. McNaney,
J. H. Eggert,
Raymond F. Smith
Publication year - 2022
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0117905
Subject(s) - optics , laser , speckle pattern , diffraction , smoothing , materials science , shock (circulatory) , shock wave , physics , mathematics , medicine , statistics , thermodynamics

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