Formation of oriented layered MoS2 from amorphous thin film revealed by polarized x-ray absorption spectroscopy | Zendy

Miloš Krbal | Zendy; Jan Přikryl | Zendy; Vit Prokop | Zendy; Igor Píš | Zendy; Federica Bondino | Zendy; Alexander V. Kolobov | Zendy

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Formation of oriented layered MoS2 from amorphous thin film revealed by polarized x-ray absorption spectroscopy

Author(s) -

Miloš Krbal,

Jan Přikryl,

Vit Prokop,

Igor Píš,

Federica Bondino,

Alexander V. Kolobov

Publication year - 2022

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/5.0106886

Subject(s) - amorphous solid , materials science , van der waals force , absorption spectroscopy , xanes , crystallography , absorption edge , crystal (programming language) , spectroscopy , crystallization , phase (matter) , covalent bond , chemical physics , extended x ray absorption fine structure , absorption (acoustics) , condensed matter physics , molecular physics , optics , chemistry , optoelectronics , band gap , physics , molecule , composite material , programming language , organic chemistry , quantum mechanics , computer science

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