Robust estimation of charge carrier diffusivity using transient photoluminescence microscopy
Author(s) -
Narumi Wong,
Seung Kyun Ha,
Kristopher Williams,
Wenbi Shcherbakov-Wu,
James W. Swan,
William A. Tisdale
Publication year - 2022
Publication title -
the journal of chemical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.071
H-Index - 357
eISSN - 1089-7690
pISSN - 0021-9606
DOI - 10.1063/5.0100075
Subject(s) - charge carrier , photoluminescence , materials science , carrier lifetime , diffusion , thermal diffusivity , transient (computer programming) , computational physics , statistical physics , optoelectronics , computer science , physics , thermodynamics , silicon , operating system
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom