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Carrier lifetimes in high-lifetime silicon wafers and solar cells measured by photoexcited muon spin spectroscopy
Author(s) -
John D. Murphy,
Nicholas E. Grant,
Sophie L. Pain,
Tim Niewelt,
Ailish Wratten,
Edris Khorani,
В. П. Маркевич,
А. R. Peaker,
Pietro P. Altermatt,
J. S. Lord,
Koji Yokoyama
Publication year - 2022
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0099492
Subject(s) - carrier lifetime , passivation , deep level transient spectroscopy , wafer , silicon , materials science , spectroscopy , charge carrier , optoelectronics , muon spin spectroscopy , muon , irradiation , analytical chemistry (journal) , atomic physics , chemistry , nanotechnology , physics , nuclear physics , layer (electronics) , quantum mechanics , chromatography

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