High resolution atomic force microscopy with an active piezoelectric microcantilever | Zendy

Hazhir Mahmoodi Nasrabadi | Zendy; Mohammad Mahdavi | Zendy; Mohammadreza Soleymaniha | Zendy; S. O. Reza Moheimani | Zendy

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High resolution atomic force microscopy with an active piezoelectric microcantilever

Author(s) -

Hazhir Mahmoodi Nasrabadi,

Mohammad Mahdavi,

Mohammadreza Soleymaniha,

S. O. Reza Moheimani

Publication year - 2022

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/5.0090668

Subject(s) - atomic force microscopy , materials science , piezoelectricity , magnetic force microscope , cantilever , piezoresponse force microscopy , kelvin probe force microscope , non contact atomic force microscopy , atomic force acoustic microscopy , resolution (logic) , scanning force microscopy , conductive atomic force microscopy , microscopy , electrostatic force microscope , photoconductive atomic force microscopy , magnetic resonance force microscopy , nanotechnology , optoelectronics , optics , scanning capacitance microscopy , physics , scanning confocal electron microscopy , ferroelectricity , composite material , dielectric , computer science , artificial intelligence , magnetization , ferromagnetic resonance , quantum mechanics , magnetic field

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