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Contact resistivity measurements and their applicability for accurate series resistance breakdown in heterojunction solar cell
Author(s) -
Luca Antognini,
LaurieLou Senaud,
Deniz Türkay,
Lison Marthey,
Julie Dréon,
Bertrand PavietSalomon,
Matthieu Despeisse,
Mathieu Boccard,
Christophe Ballif
Publication year - 2022
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0090643
Subject(s) - electrical resistivity and conductivity , equivalent series resistance , materials science , solar cell , contact resistance , series (stratigraphy) , heterojunction , optoelectronics , engineering physics , composite material , electrical engineering , geology , engineering , voltage , paleontology , layer (electronics)

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