Open AccessLeTID in HPMC-Si wafers studied by hyperspectral photoluminescence imaging
Author(s) -
Torbjørn Mehl,
Jon-Fredrik Blakstad Cappelen,
Rune Søndenå,
I. Burud,
Espen Olsen
Publication year - 2022
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0090525
Subject(s) - passivation , photoluminescence , materials science , wafer , hydrogen , degradation (telecommunications) , optoelectronics , silicon , carrier lifetime , chemical engineering , nanotechnology , electronic engineering , chemistry , organic chemistry , layer (electronics) , engineering
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