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Identifying defect parameters for common recombination centers in multicrystalline silicon by temperature and injection dependent lifetime spectroscopy
Author(s) -
Marie Syre Wiig,
Rune Søndenå,
Erik Stensrud Marstein,
H. Haug
Publication year - 2022
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0090236
Subject(s) - materials science , silicon , spectroscopy , recombination , carrier lifetime , optoelectronics , physics , biochemistry , chemistry , quantum mechanics , gene

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