Open AccessLocal defect simulation by means of the distributed circuit modelling
Author(s) -
Aloña Otaegi,
Eneko Cereceda,
Vanesa Fano,
Nekane Azkona,
F. Recart,
José Rubén Gutiérrez,
J.C. Jimeno
Publication year - 2022
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0089323
Subject(s) - modeling and simulation , laser , computer simulation , silicon , materials science , damages , distributed element model , crystalline silicon , work (physics) , computer science , voltage , biological system , luminescence , electronic engineering , optoelectronics , simulation , mechanical engineering , electrical engineering , engineering , optics , physics , law , political science , biology
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