Open AccessComparison between dark and illuminated annealing of compensated and uncompensated mc-Si wafers
Author(s) -
Guro Marie Wyller,
Marie Syre Wiig,
Bent Thomassen,
Rune Søndenå
Publication year - 2022
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0089277
Subject(s) - wafer , annealing (glass) , degradation (telecommunications) , materials science , silicon , doping , optoelectronics , electrical resistivity and conductivity , carrier lifetime , analytical chemistry (journal) , electronic engineering , composite material , chemistry , electrical engineering , environmental chemistry , engineering
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