Open AccessDeep level transient spectroscopy study of float-zone silicon degradation under light and elevated temperature
Author(s) -
Zhuangyi Zhou,
Mattias K. Juhl,
Michelle VaqueiroContreras,
Fiacre Rougieux,
Gianluca Coletti
Publication year - 2022
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0089221
Subject(s) - degradation (telecommunications) , float (project management) , materials science , silicon , spectroscopy , transient (computer programming) , deep level transient spectroscopy , temperature measurement , optoelectronics , computer science , telecommunications , thermodynamics , physics , quantum mechanics , marine engineering , engineering , operating system
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