z-logo
open-access-imgOpen Access
DX center formation in highly Si doped AlN nanowires revealed by trap assisted space-charge limited current
Author(s) -
Rémy Vermeersch,
Gwénolé Jacopin,
B. Daudin,
Julien Pernot
Publication year - 2022
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0087789
Subject(s) - doping , space charge , materials science , ohmic contact , trapping , silicon , nanowire , condensed matter physics , molecular beam epitaxy , atomic physics , electron , optoelectronics , molecular physics , nanotechnology , epitaxy , chemistry , physics , ecology , layer (electronics) , quantum mechanics , biology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom