Scanning x-ray microscopy: A sub-100 nm probe toward strain and composition in seeded horizontal Ge(110) nanowires | Zendy

M. Hanke | Zendy; Carsten Richter | Zendy; F. F. Lange | Zendy; Anna Reis | Zendy; Julia E. Parker | Zendy; Torsten Boeck | Zendy

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Scanning x-ray microscopy: A sub-100 nm probe toward strain and composition in seeded horizontal Ge(110) nanowires

Author(s) -

M. Hanke,

Carsten Richter,

F. F. Lange,

Anna Reis,

Julia E. Parker,

Torsten Boeck

Publication year - 2022

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/5.0085788

Subject(s) - materials science , nucleation , nanowire , synchrotron , microscopy , lattice (music) , diffraction , crystallography , lattice constant , condensed matter physics , synchrotron radiation , x ray crystallography , twist , germanium , x ray , optics , nanotechnology , geometry , optoelectronics , silicon , chemistry , physics , organic chemistry , acoustics , mathematics

We have spatially investigated lattice spacing, twist, and bending in individual laterally (110)-oriented Ge nanowires (NWs) on pre-patterned Si(001) substrates. A combination of synchrotron-based scanning x-ray diffraction microscopy with an x-ray focus size of 50 nm and numerical finite element calculations on the elastic strain reveals a three-dimensional relaxation scenario, which becomes particularly complex next to NW nucleation points. Despite a lattice mismatch of 4.2%, lattice compliance is preserved, since strain can effectively be released close to the seeding window. Areas in the NWs other than that appear fully relaxed. The resulting NW twist, i.e., lattice rotations around the growth axis, amounts to less than 0.1°.

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