Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution
Author(s) -
Mathijs W. H. Garming,
I. Gerward C. Weppelman,
Martin Lee,
Thijs Stavenga,
Jacob P. Hoogenboom
Publication year - 2022
Publication title -
applied physics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.084
H-Index - 66
ISSN - 1931-9401
DOI - 10.1063/5.0085597
Subject(s) - ultrashort pulse , optics , scanning electron microscope , materials science , resolution (logic) , micrometer , microscopy , laser , optoelectronics , physics , artificial intelligence , computer science
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