Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy | Zendy

G. NareshKumar | Zendy; P. R. Edwards | Zendy; Tim Batten | Zendy; M. Nouf-Allehiani | Zendy; Arantxa VilaltaClemente | Zendy; A.J. Wilkinson | Zendy; Emmanuel Le Boulbar | Zendy; Philip A. Shields | Zendy; Bohdan Starosta | Zendy; B. Hourahine | Zendy; Robert Martin | Zendy; C. TragerCowan | Zendy

Open Access

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy

Author(s) -

G. NareshKumar,

P. R. Edwards,

Tim Batten,

M. Nouf-Allehiani,

Arantxa VilaltaClemente,

A.J. Wilkinson,

Emmanuel Le Boulbar,

Philip A. Shields,

Bohdan Starosta,

B. Hourahine,

Robert Martin,

C. TragerCowan

Publication year - 2022

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/5.0080024

Subject(s) - cathodoluminescence , raman spectroscopy , materials science , microscopy , confocal , electron backscatter diffraction , scanning electron microscope , optics , electron microscope , correlative , dislocation , optoelectronics , optical microscope , diffraction , luminescence , physics , composite material , linguistics , philosophy

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