Rhombohedral and turbostratic boron nitride: X-ray diffraction and photoluminescence signatures
Author(s) -
M. Moret,
Adrien Rousseau,
Pierre Valvin,
Sachin Sharma,
Laurent Souqui,
Henrik Pedersen,
Hans Högberg,
Guillaume Cassabois,
Jianhan Li,
James H. Edgar,
Bernard Gil
Publication year - 2021
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0076424
Subject(s) - sapphire , photoluminescence , materials science , boron , diffraction , crystallography , chemical vapor deposition , epitaxy , x ray crystallography , boron nitride , stoichiometry , optoelectronics , nanotechnology , chemistry , optics , layer (electronics) , laser , physics , organic chemistry
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