Open AccessExperimentally investigating the performance degradations of the CMOS PA at different temperatures
Author(s) -
Zhao He,
Shaohua Zhou,
Meining Nie
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0071801
Subject(s) - reliability (semiconductor) , dependency (uml) , cmos , materials science , amplifier , power (physics) , temperature measurement , electronic engineering , reliability engineering , computer science , optoelectronics , engineering , physics , thermodynamics , software engineering
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