Open AccessErratum: “Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy” [AIP Adv. 7, 095116 (2017)]
Author(s) -
Zhao Guan,
Zhen-Zheng Jiang,
Bobo Tian,
Yiping Zhu,
PingHua Xiang,
Ni Zhong,
ChunGang Duan,
Junhao Chu
Publication year - 2022
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0070460
Subject(s) - piezoresponse force microscopy , ferroelectricity , materials science , condensed matter physics , atomic force microscopy , thin film , microscopy , nanotechnology , physics , optoelectronics , optics , dielectric
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