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Impact of operation parameters on the degradation of 233 nm AlGaN-based far-UVC LEDs
Author(s) -
Johannes Glaab,
Jan Ruschel,
Neysha LoboPloch,
Hyun Kyong Cho,
Frank Mehnke,
Luca Sulmoni,
Martin Guttmann,
Tim Wernicke,
M. Weyers,
S. Einfeldt,
Michael Kneissl
Publication year - 2022
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0069590
Subject(s) - optical power , current (fluid) , light emitting diode , optoelectronics , power (physics) , materials science , stress (linguistics) , diffusion , reduction (mathematics) , degradation (telecommunications) , voltage , chemistry , optics , electrical engineering , physics , thermodynamics , laser , linguistics , philosophy , geometry , mathematics , engineering

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