Open AccessAtomic-level defect modulation and characterization methods in 2D materials
Author(s) -
Odongo Francis Ngome Okello,
DongHwan Yang,
Yuseong Chu,
Sejung Yang,
SiYoung Choi
Publication year - 2021
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/5.0062633
Subject(s) - characterization (materials science) , materials science , nanotechnology , atomic units , crystallographic defect , electronic materials , engineering physics , condensed matter physics , physics , quantum mechanics , engineering
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