Open AccessAbnormal threshold voltage shifts in p-channel low temperature polycrystalline silicon TFTs under deep UV irradiation
Author(s) -
Hong Cheng,
Xinnan Lin
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0060553
Subject(s) - irradiation , threshold voltage , materials science , thin film transistor , polycrystalline silicon , ultraviolet , optoelectronics , silicon , subthreshold conduction , transistor , field effect transistor , analytical chemistry (journal) , voltage , chemistry , nanotechnology , electrical engineering , physics , layer (electronics) , chromatography , nuclear physics , engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom