Open AccessEmissivity measurement based on deep learning and surface roughness
Author(s) -
Xin Wu,
Xiaolong Wei,
Haojun Xu,
Weifeng He,
Yiwen Li,
Binbin Pei,
Caizhi Li,
Xinmin Han
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0055415
Subject(s) - emissivity , surface roughness , surface finish , materials science , infrared , simulated annealing , mean squared error , computer science , optics , remote sensing , artificial intelligence , mathematics , algorithm , physics , geology , statistics , composite material
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