Single-charge effects in silicon nanocrystals probed by atomic force microscopy: From charge blinking to nanocrystal charging | Zendy

Thierry Mélin | Zendy; D. Deresmes | Zendy

Open Access

Single-charge effects in silicon nanocrystals probed by atomic force microscopy: From charge blinking to nanocrystal charging

Author(s) -

Thierry Mélin,

D. Deresmes

Publication year - 2021

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/5.0054744

Subject(s) - nanocrystal , electrostatic force microscope , silicon , materials science , kelvin probe force microscope , surface charge , photoconductive atomic force microscopy , charge (physics) , silicon oxide , conductive atomic force microscopy , oxide , nanotechnology , microscopy , optoelectronics , biasing , molecular physics , atomic force microscopy , analytical chemistry (journal) , chemistry , scanning capacitance microscopy , voltage , optics , silicon nitride , physics , scanning confocal electron microscopy , chromatography , quantum mechanics , metallurgy

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