β-Ga2O3 on Si (001) grown by plasma-assisted MBE with γ-Al2O3 (111) buffer layer: Structural characterization
Author(s) -
Tobias Hadamek,
Agham Posadas,
Fatima Al-Quaiti,
David J. Smith,
Martha R. McCartney,
Alexander A. Demkov
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0044923
Subject(s) - molecular beam epitaxy , electron diffraction , x ray photoelectron spectroscopy , transmission electron microscopy , materials science , stoichiometry , crystallography , evaporation , layer (electronics) , diffraction , thin film , reflection (computer programming) , analytical chemistry (journal) , epitaxy , chemistry , optics , nanotechnology , nuclear magnetic resonance , physics , organic chemistry , chromatography , computer science , thermodynamics , programming language
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