Preparation and characterization of SiO2-ZrO2: Er3+/Yb3+ thin film deposited on fused silica and silicon wafer substrate via sol-gel dip coating technique | Zendy

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Preparation and characterization of SiO2-ZrO2: Er3+/Yb3+ thin film deposited on fused silica and silicon wafer substrate via sol-gel dip coating technique

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