Preparation and characterization of SiO2-ZrO2: Er3+/Yb3+ thin film deposited on fused silica and silicon wafer substrate via sol-gel dip coating technique
Author(s) -
N. Iznie Razaki,
Suraya Ahmad Kamil,
Mohd Kamil Abd Rahman
Publication year - 2021
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0043055
Subject(s) - materials science , photoluminescence , raman spectroscopy , wafer , substrate (aquarium) , thin film , doping , silicon , sol gel , crystallinity , optoelectronics , refractive index , dip coating , analytical chemistry (journal) , coating , optics , nanotechnology , composite material , chemistry , oceanography , physics , chromatography , geology
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