Open AccessMechanical strain mapping of GaAs based VCSELs
Author(s) -
Merwan Mokhtari,
Philippe Pagnod-Rossiaux,
Christophe Levallois,
François Laruelle,
Daniel T. Cassidy,
M. Bettiati,
Jean-Pierre Landesman
Publication year - 2021
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0040386
Subject(s) - materials science , vertical cavity surface emitting laser , fabrication , optoelectronics , laser , gallium arsenide , distributed bragg reflector laser , distributed bragg reflector , polarization (electrochemistry) , photoluminescence , degree of polarization , lateral strain , optics , semiconductor laser theory , anisotropy , semiconductor , composite material , chemistry , wavelength , medicine , physics , alternative medicine , pathology , scattering
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