Open AccessCharacterization and simulation of 280 nm UV-LED degradation
Author(s) -
Mengwei Su,
Xinglin Zhu,
Qi Guo,
Zhiqiang Chen,
Shaodong Deng,
Ziqian Chen,
Yukun Wang,
Jianyu Deng,
Wenhong Sun
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0040008
Subject(s) - light emitting diode , materials science , optoelectronics , heterojunction , diode , quantum well , ultraviolet , sapphire , doping , optics , laser , physics
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