Open AccessAutomated plasmon peak fitting derived temperature mapping in a scanning transmission electron microscope
Author(s) -
A. Barker,
Bibash Sapkota,
Juan Pablo Oviedo,
Robert F. Klie
Publication year - 2021
Publication title -
aip advances
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0039864
Subject(s) - plasmon , materials science , scanning transmission electron microscopy , nanoscopic scale , transmission electron microscopy , surface plasmon resonance , temperature measurement , electron energy loss spectroscopy , optics , spectroscopy , image resolution , resolution (logic) , optoelectronics , nanoparticle , nanotechnology , physics , quantum mechanics , artificial intelligence , computer science
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