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Refractive indices of MBE-grown AlxGa(1−x)As ternary alloys in the transparent wavelength region
Author(s) -
Konstantinos Papatryfonos,
T. Angelova,
A. Brimont,
Barry Reid,
Stefan Guldin,
Peter R. Smith,
Mingchu Tang,
Keshuang Li,
A.J. Seeds,
Huiyun Liu,
David R. Selviah
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0039631
Subject(s) - molecular beam epitaxy , refractive index , ternary operation , materials science , ellipsometry , wavelength , band gap , photoluminescence , optoelectronics , optics , diffraction , thin film , epitaxy , layer (electronics) , physics , nanotechnology , computer science , programming language

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