Open AccessSingle frequency vertical piezoresponse force microscopy
Author(s) -
Seungbum Hong
Publication year - 2021
Publication title -
journal of applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0038744
Subject(s) - piezoresponse force microscopy , cantilever , amplifier , non contact atomic force microscopy , microelectronics , piezoelectricity , materials science , lock in amplifier , optics , ferroelectricity , hysteresis , physics , optoelectronics , kelvin probe force microscope , microscopy , acoustics , condensed matter physics , dielectric , cmos , composite material
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