Finding the optimum design of the planar cutoff probe through a computational study
Author(s) -
Sijun Kim,
Jangjae Lee,
Young Sun Lee,
Daewoong Kim,
S. J. You
Publication year - 2021
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0033222
Subject(s) - wafer , planar , cutoff , electron density , materials science , electrode , cutoff frequency , dielectric , plasma , plasma diagnostics , antenna (radio) , acoustics , optoelectronics , computer science , electrical engineering , chemistry , physics , engineering , computer graphics (images) , quantum mechanics
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