Nanoscale phase change on Ge2Sb2Te5 thin films induced by optical near fields with photoassisted scanning tunneling microscope
Author(s) -
K. Asakawa,
Dang-il Kim,
Shotaro Yaguchi,
Mikito Tsujii,
Katsumasa Yoshioka,
Keisuke Kaneshima,
Yusuke Arashida,
Shoji Yoshida,
Hidemi Shigekawa,
Masashi Kuwahara,
Ikufumi Katayama,
Jun Takeda
Publication year - 2020
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0032573
Subject(s) - femtosecond , scanning tunneling microscope , materials science , amorphous solid , laser , nanoscopic scale , optoelectronics , optics , quantum tunnelling , microscope , nanometre , scanning probe microscopy , optical microscope , microscopy , nanotechnology , scanning electron microscope , chemistry , physics , crystallography , composite material
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