Erratum: “Characterization of epitaxial titanium nitride mediated single-crystal nickel oxide grown on MgO-(100) and Si-(100)” [AIP Adv. 10, 065318 (2020)]
Author(s) -
Jian Liang,
KuangHui Li,
Chun Hong Kang,
Laurentiu Braic,
A. Kiss,
C.N. Zoita,
Tien Khee Ng,
Boon S. Ooi
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0031434
Subject(s) - materials science , epitaxy , nickel , nitride , characterization (materials science) , titanium nitride , titanium , nickel oxide , titanium oxide , optoelectronics , nanotechnology , metallurgy , chemical engineering , layer (electronics) , engineering
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