Open AccessX-ray reflecto-interferometer based on compound refractive lenses for thin-films study
Author(s) -
Maria Voevodina,
Svetlana Lyatun,
A. A. Barannikov,
Ivan Lyatun,
Dmitry Zverev,
I. Snigireva,
A. Snigirev
Publication year - 2020
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0031390
Subject(s) - optics , interferometry , x ray optics , beamline , materials science , interference (communication) , refractive index , beam (structure) , x ray , optoelectronics , physics , computer science , computer network , channel (broadcasting)
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