X-ray phase-contrast imaging technique based on a bilens interferometer
Author(s) -
D. Zverev,
I. Snigireva,
S. Kuznetsov,
V. Yunkin,
A. Snigirev
Publication year - 2020
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/5.0031282
Subject(s) - interferometry , optics , phase contrast imaging , beamline , phase (matter) , x ray phase contrast imaging , image resolution , contrast (vision) , phase retrieval , physics , materials science , phase contrast microscopy , fourier transform , beam (structure) , quantum mechanics
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