Trace element limitation of lymph nodes structure according to the x-ray fluorescent analysis with synchrotron radiation (SR XRF) | Zendy

Olga Gorchakova | Zendy; Yu. P. Kolmogorov | Zendy; В. Н. Горчаков | Zendy; Г. А. Демченко | Zendy; С. Н. Абдрешов | Zendy

Open Access

Trace element limitation of lymph nodes structure according to the x-ray fluorescent analysis with synchrotron radiation (SR XRF)

Author(s) -

Olga Gorchakova,

Yu. P. Kolmogorov,

В. Н. Горчаков,

Г. А. Демченко,

С. Н. Абдрешов

Publication year - 2020

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/5.0030489

Subject(s) - lymph , lymph node , trace element , lymphatic system , immune system , trace (psycholinguistics) , pathology , medicine , chemistry , immunology , linguistics , philosophy , organic chemistry

Unique properties of X-ray fluorescent analysis with synchrotron radiation and classical morphological method allowed to reveal interrelation between the trace elements content and structure of lymph nodes. Belonging of lymph nodes to different regions is defining in formation of a certain microelemental profile and features of the microanatomic organization of lymph nodes. The research purpose – it is to establish causal connection between the content of trace elements and structure of lymph nodes of different localization.

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