Characterization of ferroelectric domain walls by scanning electron microscopy | Zendy

Kasper A. Hunnestad | Zendy; Erik D. Roede | Zendy; Antonius T. J. van Helvoort | Zendy; Dennis Meier | Zendy

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Characterization of ferroelectric domain walls by scanning electron microscopy

Author(s) -

Kasper A. Hunnestad,

Erik D. Roede,

Antonius T. J. van Helvoort,

Dennis Meier

Publication year - 2020

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/5.0029284

Subject(s) - ferroelectricity , mesoscopic physics , nanotechnology , characterization (materials science) , nanoscopic scale , electron tomography , domain (mathematical analysis) , scanning electron microscope , microscopy , materials science , scanning probe microscopy , bridging (networking) , computer science , optics , physics , scanning transmission electron microscopy , optoelectronics , condensed matter physics , mathematical analysis , computer network , mathematics , transmission electron microscopy , dielectric , composite material

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