Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions
Author(s) -
Lucia Skopinski,
Philipp Ernst,
Matthias Herder,
Roland Kozubek,
Lukas Madauß,
Stephan Sleziona,
André Maas,
N. Königstein,
H. Lebius,
A. Wucher,
Marika Schleberger
Publication year - 2021
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/5.0025812
Subject(s) - kinetic energy , reflectron , ion , atomic physics , range (aeronautics) , time of flight , mass spectrometry , projectile , ionization , time of flight mass spectrometry , irradiation , charged particle , electron , materials science , chemistry , physics , optics , nuclear physics , quantum mechanics , metallurgy , composite material , organic chemistry , chromatography
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