Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films
Author(s) -
Hyeon Jun Lee,
Jeongyong Kim,
Seung Hyun Hwang,
Hyeokmin Choe,
Semën Gorfman,
YeongJae Heo,
Su Yong Lee,
PierreEymeric Janolin,
Igor Kornev,
Tobias U. Schülli,
Carsten Richter,
JooHyoung Lee,
U. Pietsch,
ChanHo Yang,
Ji Young Jo
Publication year - 2020
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/5.0025673
Subject(s) - materials science , multiferroics , ferroelectricity , electric field , nucleation , polarization (electrochemistry) , phase (matter) , condensed matter physics , phase boundary , nanoscopic scale , thin film , transient (computer programming) , epitaxy , transformation (genetics) , optoelectronics , nanotechnology , computer science , dielectric , physics , chemistry , thermodynamics , biochemistry , quantum mechanics , gene , operating system , layer (electronics)
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