Open AccessPublisher’s Note: “On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing” [Rev. Sci. Instrum. 91, 083702 (2020)]
Author(s) -
Daniele Piras,
P.L.M.J. van Neer,
Rutger Thijssen,
Hamed Sadeghian
Publication year - 2020
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/5.0025011
Subject(s) - sizing , atomic force microscopy , feature (linguistics) , resolution (logic) , microscopy , computer science , nanotechnology , geology , materials science , optics , physics , artificial intelligence , chemistry , philosophy , linguistics , organic chemistry
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