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Carrier dynamics near a crack in GaN microwires with AlGaN multiple quantum wells
Author(s) -
Sylvain Finot,
Vincent Grenier,
Vitaly Z. Zubialevich,
Catherine Bougerol,
Pietro Pampili,
J. Eymery,
P. J. Parbrook,
Christophe Durand,
Gwénolé Jacopin
Publication year - 2020
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0023545
Subject(s) - cathodoluminescence , materials science , heterojunction , relaxation (psychology) , quantum well , optoelectronics , dislocation , stress relaxation , transmission electron microscopy , radiative transfer , molecular physics , condensed matter physics , optics , luminescence , composite material , laser , nanotechnology , creep , chemistry , psychology , social psychology , physics

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