High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser | Zendy

L. Wollenweber | Zendy; Thomas R. Preston | Zendy; Adrien Descamps | Zendy; Valerio Cerantola | Zendy; Andrew Comley | Zendy; J. H. Eggert | Zendy; L. B. Fletcher | Zendy; Gianluca Geloni | Zendy; D. O. Gericke | Zendy; S. H. Glenzer | Zendy; S. Göde | Zendy; J. B. Hastings | Zendy; Oliver Humphries | Zendy; A. Jenei | Zendy; O. Karnbach | Zendy; Zuzana Konôpková | Zendy; R. Loetzsch | Zendy; Berit Marx-Glowna | Zendy; E. E. McBride | Zendy; D. McGonegle | Zendy; G. Monaco | Zendy; Benjamin K. Ofori-Okai | Zendy; C. A. J. Palmer | Zendy; Christian Plückthun | Zendy; R. Redmer | Zendy; C. Strohm | Zendy; Ian Thorpe | Zendy; T. Tschentscher | Zendy; I. Uschmann | Zendy; J. S. Wark | Zendy; Thomas G. White | Zendy; Karen Appel | Zendy; G. Gregori | Zendy; U. Zastrau | Zendy

Open Access

High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser

Author(s) -

L. Wollenweber,

Thomas R. Preston,

Adrien Descamps,

Valerio Cerantola,

Andrew Comley,

J. H. Eggert,

L. B. Fletcher,

Gianluca Geloni,

D. O. Gericke,

S. H. Glenzer,

S. Göde,

J. B. Hastings,

Oliver Humphries,

A. Jenei,

O. Karnbach,

Zuzana Konôpková,

R. Loetzsch,

Berit Marx-Glowna,

E. E. McBride,

D. McGonegle,

G. Monaco,

Benjamin K. Ofori-Okai,

C. A. J. Palmer,

Christian Plückthun,

R. Redmer,

C. Strohm,

Ian Thorpe,

T. Tschentscher,

I. Uschmann,

J. S. Wark,

Thomas G. White,

Karen Appel,

G. Gregori,

U. Zastrau

Publication year - 2021

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/5.0022886

Subject(s) - monochromator , optics , laser , spectrum analyzer , physics , scattering , resolution (logic) , detector , inelastic scattering , free electron laser , wavelength , artificial intelligence , computer science

We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-backscattering geometry to reach a high spectral resolution. An energy resolution of 44 meV is demonstrated for the experimental setup, close to the theoretically achievable minimum resolution. The analyzer crystals and detector are mounted on a curved-rail system, allowing quick and reliable changes in scattering angle without breaking vacuum. The entire setup is designed for operation at 10 Hz, the same repetition rate as the high-power lasers available at the instrument and the fundamental repetition rate of the European XFEL. Among other measurements, it is envisioned that this setup will allow studies of the dynamics of highly transient laser generated states of matter.

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