Frequency domain analysis of 3ω-scanning thermal microscope probe—Application to tip/surface thermal interface measurements in vacuum environment | Zendy

Gilles Pernot | Zendy; Anas Metjari | Zendy; H. Chaynes | Zendy; M. Weber | Zendy; Mykola Isaiev | Zendy; David Lacroix | Zendy

Open Access

Frequency domain analysis of 3ω-scanning thermal microscope probe—Application to tip/surface thermal interface measurements in vacuum environment

Author(s) -

Gilles Pernot,

Anas Metjari,

H. Chaynes,

M. Weber,

Mykola Isaiev,

David Lacroix

Publication year - 2021

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/5.0020975

Subject(s) - scanning thermal microscopy , characterization (materials science) , materials science , thermal contact conductance , finite element method , scanning probe microscopy , thermal conductivity , thermal , thermal contact , microscope , thermal analysis , thermal conductivity measurement , sensitivity (control systems) , microscopy , thermal resistance , optoelectronics , optics , nanotechnology , electronic engineering , composite material , physics , meteorology , thermodynamics , engineering

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