Atomic-resolution analytical scanning transmission electron microscopy of topological insulators with a layered tetradymite structure | Zendy

Danielle Reifsnyder Hickey | Zendy; K. Andre Mkhoyan | Zendy

Open Access

Atomic-resolution analytical scanning transmission electron microscopy of topological insulators with a layered tetradymite structure

Author(s) -

Danielle Reifsnyder Hickey,

K. Andre Mkhoyan

Publication year - 2020

Publication title -

apl materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.571

H-Index - 60

ISSN - 2166-532X

DOI - 10.1063/5.0014113

Subject(s) - topological insulator , characterization (materials science) , atomic units , scanning transmission electron microscopy , spintronics , materials science , topology (electrical circuits) , nanotechnology , transmission electron microscopy , physics , condensed matter physics , quantum mechanics , ferromagnetism , mathematics , combinatorics

The recent discovery of topological insulators has uncovered exciting new quantum materials with potential applications in the emergent fields of topological spintronics and topological quantum computation. At the heart of uncovering the new physical properties of these materials is the characterization of their atomic structures, composition, defects, and interfaces. The technique of atomic-resolution analytical scanning transmission electron microscopy has already provided many insights and holds great promise for future discoveries. This perspective discusses advances that have been achieved in the atomic-scale characterization of topological insulators with a layered tetradymite structure, and it proposes future directions to link atomic-scale features to exciting new physical phenomena.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research