Open AccessMutual interference induced by single event effects in CMOS circuits
Author(s) -
Lili Ding,
Wei Chen,
Tan Wang,
Fengqi Zhang,
Yinhong Luo,
Yang Guo-qing
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0013051
Subject(s) - interconnection , cmos , materials science , single event upset , upset , electronic circuit , optoelectronics , voltage drop , voltage , spice , electrical engineering , engineering , telecommunications , static random access memory , mechanical engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom