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Proton irradiation impact on interface traps under Schottky contact in AlGaN/GaN heterostructure
Author(s) -
Xuefeng Zheng,
Guanjun Chen,
Xiaohu Wang,
Yingzhe Wang,
Chong Wang,
Wei Mao,
Yang Lu,
Bin Hou,
Minhan Mi,
Ling Lv,
Yanrong Cao,
Qing Zhu,
Gang Guo,
Peijun Ma,
Xiaohua Ma,
Yue Hao
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0007650
Subject(s) - irradiation , materials science , schottky barrier , proton , heterojunction , schottky diode , reverse leakage current , optoelectronics , atomic physics , analytical chemistry (journal) , chemistry , nuclear physics , physics , diode , chromatography

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