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Effects of growth temperature on electrical properties of GaN/AlN based resonant tunneling diodes with peak current density up to 1.01 MA/cm2
Author(s) -
Evan M. Cornuelle,
Tyler A. Growden,
David F. Storm,
E. R. Brown,
Weidong Zhang,
Brian P. Downey,
Vikrant J. Gokhale,
Laura B. Ruppalt,
James G. Champlain,
Prudhvi Peri,
Martha R. McCartney,
David J. Smith,
David J. Meyer,
Paul R. Berger
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0005062
Subject(s) - molecular beam epitaxy , materials science , diode , resonant tunneling diode , figure of merit , optoelectronics , current density , quantum tunnelling , yield (engineering) , substrate (aquarium) , equivalent series resistance , layer (electronics) , epitaxy , voltage , quantum well , optics , nanotechnology , laser , physics , oceanography , quantum mechanics , geology , metallurgy

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