Interfacial properties in energy storage systems studied by soft x-ray absorption spectroscopy and resonant inelastic x-ray scattering | Zendy

Qinghao Li | Zendy; Shishen Yan | Zendy; Wanli Yang | Zendy

Open Access

Interfacial properties in energy storage systems studied by soft x-ray absorption spectroscopy and resonant inelastic x-ray scattering

Author(s) -

Qinghao Li,

Shishen Yan,

Wanli Yang

Publication year - 2020

Publication title -

the journal of chemical physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.071

H-Index - 357

eISSN - 1089-7690

pISSN - 0021-9606

DOI - 10.1063/5.0003311

Subject(s) - spectroscopy , synchrotron , resonant inelastic x ray scattering , scattering , materials science , inelastic scattering , x ray photoelectron spectroscopy , x ray spectroscopy , absorption (acoustics) , absorption spectroscopy , electrochemistry , energy storage , soft x ray emission spectroscopy , analytical chemistry (journal) , optics , chemistry , time resolved spectroscopy , electrode , physics , nuclear magnetic resonance , inelastic neutron scattering , composite material , quantum mechanics , chromatography , power (physics)

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